JPS55148436A - Probe base plate - Google Patents
Probe base plateInfo
- Publication number
- JPS55148436A JPS55148436A JP5725279A JP5725279A JPS55148436A JP S55148436 A JPS55148436 A JP S55148436A JP 5725279 A JP5725279 A JP 5725279A JP 5725279 A JP5725279 A JP 5725279A JP S55148436 A JPS55148436 A JP S55148436A
- Authority
- JP
- Japan
- Prior art keywords
- base plate
- probe base
- probe
- socket
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title abstract 11
- 239000004065 semiconductor Substances 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5725279A JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5725279A JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55148436A true JPS55148436A (en) | 1980-11-19 |
JPS626653B2 JPS626653B2 (en]) | 1987-02-12 |
Family
ID=13050331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5725279A Granted JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55148436A (en]) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4514022A (en) * | 1983-06-29 | 1985-04-30 | Tektronix, Inc. | Probe cable assemblies |
US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
US4926117A (en) * | 1988-05-02 | 1990-05-15 | Micron Technology, Inc. | Burn-in board having discrete test capability |
US5923176A (en) * | 1991-08-19 | 1999-07-13 | Ncr Corporation | High speed test fixture |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53102379U (en]) * | 1977-01-20 | 1978-08-18 |
-
1979
- 1979-05-10 JP JP5725279A patent/JPS55148436A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53102379U (en]) * | 1977-01-20 | 1978-08-18 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4514022A (en) * | 1983-06-29 | 1985-04-30 | Tektronix, Inc. | Probe cable assemblies |
US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
US4926117A (en) * | 1988-05-02 | 1990-05-15 | Micron Technology, Inc. | Burn-in board having discrete test capability |
US5923176A (en) * | 1991-08-19 | 1999-07-13 | Ncr Corporation | High speed test fixture |
Also Published As
Publication number | Publication date |
---|---|
JPS626653B2 (en]) | 1987-02-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6427668U (en]) | ||
ATE69897T1 (de) | Hochleistungsfluessigkristallanzeigevorrichtung und verfahren zur herstellung. | |
DK343286D0 (da) | Ionfrembringelsesapparat | |
US3818325A (en) | Battery testing device | |
MY122226A (en) | Process for manufacturing semiconductor device | |
JPS55148436A (en) | Probe base plate | |
ES8200771A1 (es) | Dispositivo para la medicion de la intensidad de la corrien-te en carriles conductores de corriente,especialmente en la electrolisis para el refinado de cobre | |
MY112140A (en) | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same | |
GB1382879A (en) | Corrosion probe assembly | |
JPS5599734A (en) | Pattern-sheet for characteristic test of semiconductor element | |
JPS6457632A (en) | Double contact probe device | |
RU93005234A (ru) | Измерительный пробник | |
JPS6454267A (en) | Contact probe | |
US2233646A (en) | Interconnectible portable indicating instruments | |
JPS5487070A (en) | Simultaneous multi-contact probe | |
JPS641249A (en) | Wafer prober | |
JPS5520015A (en) | Piezoelectric device | |
JPS649377A (en) | Testing method and sheet for integrated circuit package | |
SU572862A2 (ru) | Устройство дл подключени выводов радиодеталей к измерительному блоку | |
JPS5744866A (en) | High-temperature testing device for semiconductor device | |
SU132422A1 (ru) | Влагомер | |
JPS6439743A (en) | Container for integrated circuit | |
JPS5447496A (en) | Thin plate tuning fork type crystal vibrator | |
RU94030576A (ru) | Устройство для определения дугостойкости контактов и контактных материалов | |
JPS5736841A (en) | Chip testing device |